LTE test, LTE, LTE Americas 2009, Agilent Technologies

Agilent Technologies to Show Latest LTE Test Solutions at LTE Americas 2009

News Release from: Agilent
02/11/2009

Agilent Technologies has announced it will demonstrate its latest LTE test solutions at the LTE Americas 2009 conference in Dallas, Texas, Nov. 4-5. Demonstrations include Protocol & Device Validation Test, Drive Test, Signal Analyzer and Installation and Maintenance tools for spectrum analysis/cable antenna test.

Agilent is delivering an industry-leading test portfolio for the LTE development lifecycle, said Ron Nersesian, president of Agilent's Electronic Measurement Group. We have introduced several first-to-market LTE test products to ensure the successful rollout of LTE, and we're excited to be a part of this significant conference.

LTE Americas, a collaboration between 3GPP and Informa, brings together LTE visionaries across the industry to discuss and debate the key issues surrounding LTE development and deployment. Along with its partners, Agilent provides a broad, comprehensive portfolio of solutions that address the entire UE LTE and eNB lifecycle -- from early development through production test and deployment.