ATE, Autotestcon 2009, Agilent Technologies
Agilent Technologies to Showcase Latest ATE Innovations at Autotestcon 2009
News Release from:
09 September 2009
Agilent Technologies Inc. today announced it will display its innovative line-up of ATE test systems, support and asset management at Autotestcon 2009. The show takes place Sept. 14-17 at the Disneyland Hotel Convention Center, in Anaheim, Calif. In addition to demonstrating test solutions in high-power signal generation, audio analysis, data conversion, signal processing and real-time temperature testing, Agilent will present six technical papers.
Agilent has been a long-term COTS supplier for this industry, delivering state-of-the-art equipment and solutions that meet customers' long-term sustainability needs, said Agilent's Barry Alcorn, wireless/digital marketing manager. We are excited and committed to working with the industry through our technical collaboration, as shown through our six technical papers that deliver real practical value to event attendees.
* Agilent's Option 521 for the analog PSG signal generator, E8257D 67GHz, provides power output that breaks the 1-watt barrier in a standalone instrument. The Agilent PSG with the high-power configuration can help simplify the testing of high-power amplifiers, overcome losses within automated test equipment (ATE) systems, and address the attenuation of signals within long cable runs.
* Agilent power meters operate with sensors of various types (CW, average and peak and average), covering numerous frequency and power ranges to accurately measure the power of RF and microwave signals. They are excellent for applications such as testing the output power of communication base-station transmitters, cellular telephones and radar system equipment.
* The Agilent U8903A, a next-generation audio analyzer with one or two channels, combines the functionality of a distortion meter, SINAD meter, frequency counter, AC voltmeter, DC voltmeter and FFT analyzer with a low distortion audio source. It operates at DC and from 10 Hz to 100 kHz and contains industry-standard connectors (balanced and unbalanced).
* Agilent's Fault Detective, Test Optimization and Diagnostic Software Solution is a two-tiered software suite that enables users to derive new understanding and mastery of their testing strategy while simultaneously making possible amazingly accurate and easy-to-perform diagnostics.
* Agilent's high-resolution digitizers with LXI connectivity for R&D and manufacturing engineers, the L4532A 2-channel and L4534A 4-channel, are high-performance, stand-alone LXI digitizers that offer simultaneous sampling at up to 20 MS/s, +/-250V isolated inputs and 16-bit resolution. The digitizers were designed for use in aerospace/defense, communications, automotive and medical applications.
* Agilent's high-speed, high-resolution VME/VXS digitizers are ideal for electronic warfare (EW) and radar applications. The SVM3500 is a quad-channel 12-bit digitizer allowing channel interleaving to provide sampling up to 2 GS/s and more than 2 GHz analog bandwidth, while the SVM4800 is an eight-channel 14-bit digitizer with more than 300 MHz input signal bandwidth, achieving sampling of up to 125 MS/s.
Agilent experts will present six papers at Autotestcon 2009 on topics including thermal testing, ATE upgrading and generating higher output power signals. They will also participate in technical sessions on LXI (Getting Your Measurements on the Web and Connectivity Standards that Improve ATE System Design).