|
Search
|
ATE Systems
ACS Test System Now Completes Wafer Level Reliability Testing up to Five Times FasterKeithley Instruments has enhanced its Automated Characterization Suite (ACS) software to include optional wafer level reliability (WLR) test tools for semiconductor reliability and lifetime prediction testing applications. Version 4.0 builds on the ACS software's existing single- and multi-site parallel test capabilities, adding a database capability, as well as software tools and optional licenses for the new Reliability Test Module (RTM) and ACS Data Analysis capabilities.
ACS Test System Now Completes Wafer Level Reliability Testing up to Five Times FasterKeithley Instruments has enhanced its Automated Characterization Suite (ACS) software to include optional wafer level reliability (WLR) test tools for semiconductor reliability and lifetime prediction testing applications. Version 4.0 builds on the ACS software's existing single- and multi-site parallel test capabilities, adding a database capability, as well as software tools and optional licenses for the new Reliability Test Module (RTM) and ACS Data Analysis capabilities.
ACS Test System Now Completes Wafer Level Reliability Testing up to Five Times FasterKeithley Instruments has enhanced its Automated Characterization Suite (ACS) software to include optional wafer level reliability (WLR) test tools for semiconductor reliability and lifetime prediction testing applications. Version 4.0 builds on the ACS software's existing single- and multi-site parallel test capabilities, adding a database capability, as well as software tools and optional licenses for the new Reliability Test Module (RTM) and ACS Data Analysis capabilities.
ACS Test System Now Completes Wafer Level Reliability Testing up to Five Times FasterKeithley Instruments has enhanced its Automated Characterization Suite (ACS) software to include optional wafer level reliability (WLR) test tools for semiconductor reliability and lifetime prediction testing applications. Version 4.0 builds on the ACS software's existing single- and multi-site parallel test capabilities, adding a database capability, as well as software tools and optional licenses for the new Reliability Test Module (RTM) and ACS Data Analysis capabilities. JTAG/Boundary Scan Platform with new Transceivers for highly complex BoardsGOEPEL electronic, a vendor of JTAG/Boundary Scan solutions compliant with Std. IEEE1149.1, has launched an additional component for its Boundary Scan hardware platform SCANFLEX called SFX-TAP7. 
ATE System features fully-integrated JTAG/Boundary ScanAeroflex has introduced the 5800 Series multi-configuration, multi-function Automatic Test Equipment (ATE) system with integrated JTAG/boundary scan capabilities. The 5800 Series will feature, as an option, the PXI-based SCANFLEX platform from GOEPEL electronic, a leading vendor of JTAG/boundary scan solutions. 
ATE system has digital functional testingAeroflex now offers its 5800 Series ATE system with digital functional testing capabilities. Ideal for engineers performing mixed-signal testing, device programming, functional test, in-system programming, or simple protocol communications, the 5800 Series was designed with an open architecture and highly configurable structure that allows it to easily adapt to evolving Printed Circuit Board (PCB) industry standards, providing a versatile solution that can be easily upgraded to satisfy future requirements as they emerge. 
Product safety testing system upgradedClare Instruments has upgraded its Elite electronic product safety testing system with the introduction of a number of additional technical features. The functional load test current of the new Elite has been raised to 16 amps making it suitable for the safety testing of the vast majority of domestic electrical and electronic products. 
Aeroflex enhances the capability of its 5800 Series multi-configuration, multi-function ATE systemAeroflex has improved the functionality of its 5800 Series multi-configuration, multi-function ATE system with the addition of a Boundary Scan and Q-Test capability along with a PXI software wrapper tool. The Aeroflex 5800 Series is a highly flexible, scalable and modular test environment designed to provide the true re-configurability needed to meet the ever-changing requirements of the rapidly evolving PCB industry. |
Headlines
 |
 Interested in advertising with us?
Click here
|
||
- © Copyright Electronic Specifier - Electronics News
- Website design, hosting & Technology: Strategies Group Plc